ESD: Failure Mechanisms and Models
Electrostatic discharge (ESD) failure mechanisms continue to impactsemiconductor components and systems as technologies scale frommicro- to nano-electronics.
This book studies electrical overstress, ESD, and latchup from afailure analysis and case-study approach. It provides a clearinsight into the physics of failure from a generalist perspective,followed by investigation of failure mechanisms in specifictechnologies, circuits, and systems. The book is unique in coveringboth the failure mechanism and the practical solutions to fix theproblem from either a technology or circuit methodology.
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ESD: Failure Mechanisms and Models is a continuation ofthe author€s series of books on ESD protection. It is anessential reference and a useful insight into the issues thatconfront modern technology as we enter the Nano-electronic era.